• X-ray Fluorescence Analysis (XRF):
Qualitatively and quantitatively analyze material composition.
Identify elements present in samples using spectral analysis.
Determine material purity and detect impurities.
• Micro-Sectioning:
Prepare microsection samples for detailed analysis.
Examine assemblies, solder joints, components, chips, and bondings.
Visualize material transitions and measure layer thicknesses.
Identify defects, root causes, and potential failures.
• Digital Microscopy:
Examine solder joints, prepared samples, and component surfaces.
Achieve magnifications up to 2500x for precise analysis.
Perform 2D and 3D measurements and create height profiles.
Assess component surfaces for discoloration, abnormalities, and compliance with IPC-A-610 standards.